Patent · US Expired

Incremental method for critical area and critical region computation of via blocks

US6247853A · kind A · utility

72Cited by
9References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 26, 1998
Grant dateJun 19, 2001
Priority date
Expiry dateMay 26, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L22/20
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An efficient computer implemented method computes critical area for via blocks in Very Large Scale Integrated (VLSI) circuits. The method is incremental and takes advantage of the hierarchy in the design. In order to increase the efficiency further we use the L.sub..infin. or the L.sub.1 metric instead of the Euclidean geometry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.