Method for design and development of a semiconductor laser device
US6248604A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 14, 1999 |
| Grant date | Jun 19, 2001 |
| Priority date | — |
| Expiry date | Sep 14, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0014
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for testing semiconductor laser devices is described. The method includes testing a monolithically integrated semiconductor laser device via electrical contact testing and/or far field testing. These tests will provide the total performance of the entire device. Further, the method includes accurate cleaving off of a portion of the laser device and re-testing to determine the relative performance of the remainder of the device. Through comparison of the test and re-test results, it is possible to reduce the design cycle for monolithically integrated semiconductor laser devices by detecting design flaws and imperfections or by ascertaining a more advantageous design.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.