Patent · US Expired

Dendritic material sacrificial layer micro-scale gap formation method

US6248668A · kind A · utility

7Cited by
1References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 14, 2000
Grant dateJun 19, 2001
Priority date
Expiry dateJan 14, 2020

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2201/0108
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A micro-scale gap fabrication process using a dry releasable dendritic material sacrificial layer. The fabrication process produces micro-scale gaps, such as those required between a suspended microstructure and an opposing surface in MEMS. The dendritic sacrificial layer is releasable by heating the dendritic material past its decomposition point after forming the microstructure. The sacrificial layer may be applied to a wafer, for example, by spin coating a solution including the dissolved dendritic material. The sacrificial layer, after being formed, may be patterned and prepared for accepting structural material for the microstructure. After a desired microstructure or microstructures are formed around the sacrificial layer, the layer is dry releasable by heating.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.