High frequency probe

US6252391A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Michael F. McAllister · Clintondale, US
• Klaus Kempter · Freising, DE
• Charles F. Pells · Wappingers Falls, US
• Stephan Richter · Neubiberg, DE
• Gerhard Ruehle · Sindelfingen, DE

Key dates

• Filing date: Aug 28, 1998
• Grant date: Jun 26, 2001
• Expiry date: Aug 28, 2018

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/06772
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A high frequency probe is presented. The probe comprises a probe body having a coaxial resilient double ended probe element attached thereto by an adaptor. A locking pin is attached to the probe adaptor and extends parallel to the probe element, however, it is slightly shorter as the locking pin should not contact any pins of the device being probed. The locking pin serves to hold the probe in place. Alternatively, a high frequency differential probe is presented. The high frequency differential probe comprises a base having a first pair of opposing spring steel plates and a second adjacent pair of opposing spring steel plates connected thereto. The first pair of spring plates are also connected to a first probe adaptor and the second pair of spring plates are also connected to a second probe adaptor. A first probe body is mounted at an angle to the first adaptor and a second probe body is mounted at an angle to the second adaptor. A first coaxial resilient double ended probe element connected to the first probe body by the first adaptor and a second coaxial resilient double ended probe element connected to the second probe body by the second adaptor.