Method and apparatus for testing circuits having different configurations with a single test fixture
US6252414A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 26, 1998 |
| Grant date | Jun 26, 2001 |
| Priority date | — |
| Expiry date | Aug 26, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A fixture for testing circuits includes a rectangular array of conductive test pads, alternating with insulating areas in a checkerboard-like pattern. In a first embodiment, the entire array is printed on a central portion of a plastic membrane, with outer portions of the membrane carrying electrical lines from the test pads to connectors. In a second embodiment, the rectangular array is formed on surfaces of a number of closely packet plastic membranes, each of which has tabs extending away from the testing surface to connectors. The test fixture is generic, not being configured for testing a particular circuit configuration. To compensate for conditions of linear misalignment, the rectangular array is moved in a raster pattern having a size equal to the cell size of the rectangular array. To compensate for conditions of angular misalignment, the array may be rotated after such misalignment is measured, or test results may be compared with exemplary data for a number of misalignment conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.