Three dimensional measurement apparatus
US6252659A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 22, 1999 |
| Grant date | Jun 26, 2001 |
| Priority date | — |
| Expiry date | Mar 22, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional measurement apparatus includes an optical system for scanning a reference beam across a target object to be measured, a light sensor which receives light reflected from the target object, and a processor for calculating a three-dimensional shape of the target object from the received light. An image for calculating the three-dimensional shape of the target object and an image for displaying the target object are both captured by the same sensor. The displayed image is a grayscale image that is based on a centroid that is calculated from multiple data samples taken for each pixel in the image as the target is being scanned.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.