Semiconductor laser reliability test structure and method
US6255707A · kind A · utility
6Cited by
9References
34Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 24, 1998 |
| Grant date | Jul 3, 2001 |
| Priority date | — |
| Expiry date | Aug 24, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/32341
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The invention relates to semiconductor lasers and more particularly to structures which enable the semiconductor lasers to be tested for reliability. The invention further relates to methods for testing the reliability of semiconductor lasers in wafer or chip form. The invention also relates to methods for the fabrication of semiconductor lasers which includes the use of reliability tests in the fabrication process where the reliability tests includes measuring the voltage drop or drops across one or more levels of a laser structure during the passage of current through the structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.