Low-frequency noise removing method and a related CMOS sensing circuit
US6255976A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 27, 1999 |
| Grant date | Jul 3, 2001 |
| Priority date | — |
| Expiry date | Oct 27, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/60
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An intentional offset value is set beforehand. The intentional offset value is larger than a sensing objective signal "sig." A measuring device is provided for measuring the intentional offset value to obtain a measured intentional offset value "a" representing the quantity of the intentional offset value, and also for measuring a sum of the sensing objective signal "sig" and the intentional offset value to obtain a measured signal value "b" representing a summation of the quantity of the sensing objective signal and the quantity of the intentional offset value. A ratio (b/a) of the measured signal value to the measured intentional offset value is obtained. The obtained ratio is used as noise reducing data for reducing the noise involved in a sensor output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.