Patent · US Expired

Apparatus for reduction of selected ion intensities in confined ion beams

US6259091A · kind A · utility

30Cited by
11References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 15, 1998
Grant dateJul 10, 2001
Priority date
Expiry dateJun 15, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/145
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An apparatus for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the apparatus has an ion trap or a collision cell containing a reagent gas wherein the reagent gas accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the collision cell as employed in various locations within analytical instruments including an inductively coupled plasma mass spectrometer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.