Patent · US Expired

Target acquisition system and radon transform based method for target azimuth aspect estimation

US6259396A · kind A · utility

36Cited by
3References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 26, 1999
Grant dateJul 10, 2001
Priority date
Expiry dateAug 26, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V10/255
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A Radon transform based method that provides for target azimuth aspect estimation and target shape measurement. A Radon transform is applied to a binary (N.times.N pixels) target chip to extract target features that are then used to measure length, width, and diagonal features of the target. In parallel, these features are used to estimate the azimuth aspect angle, or size, of the target. The method is effective in discriminating targets from clutter. The method is also very time efficient and highly flexible in its operation because the features can automatically account for any target rotation or shift. The present invention also provides for a target acquisition system that employs the Radon transform based method for target azimuth aspect estimation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.