Patent · US Expired

Memory devices with verifying input/output buffer circuits and methods of operation thereof

US6259628A · kind A · utility

33Cited by
2References
31Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 18, 1998
Grant dateJul 10, 2001
Priority date
Expiry dateDec 18, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3459
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The disclosure is a nonvolatile semiconductor memory having a plurality of memory cells, the memory cells being programmed and erased. The memory comprises a memory cell array having the memory cells arranged in a matrix, a sense amplifier for detecting a state of the memory cell, an input/output buffer for receiving an output of the sense amplifier and for generating an output responding to the output of the sense amplifier, a verifying circuit for generating an output responding to the output of the input/output buffer, and a control logic block for receiving signals relevant to verifying operations after programming and erasing and for generating signals controlling the input/output buffer and verifying circuit. The verifying operations for programmed and erased cells are conductive through the sense amplifier, the input/output buffer and verifying circuit, in common.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.