Patent · US Expired

High quality, semi-insulating gallium nitride and method and system for forming same

US6261931A · kind A · utility

59Cited by
10References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 1998
Grant dateJul 17, 2001
Priority date
Expiry dateJun 19, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0262
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for growing high-quality gallium nitride over a substrate is disclosed. The method comprises growing first layer with a high dislocation density over the substrate, a second layer having a high number of point defects and a reduced dislocation density as compared to the dislocation density of the first layer over the first layer, and a third layer having a reduced number of point defects as compared to the second layer over the second layer. The resulting gallium nitride is semi-insulating, which inhibits parasitic current flow and parasitic capacitive effects, yet it not so insulating that electron flow in adjacent transistor channels is inhibited.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.