Apparatus for I/O leakage self-test in an integrated circuit
US6262585A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 1999 |
| Grant date | Jul 17, 2001 |
| Priority date | — |
| Expiry date | Jun 14, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31715
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one embodiment, an integrated circuit is disclosed that includes a first input/output (I/O) circuit and a leakage detection circuit coupled to the first I/O circuit. In a test mode of operation, the leakage detection circuit tests the first I/O circuit for excessive leakage current. According to another embodiment, the integrated circuit also includes a first resistor coupled between a line voltage and the first I/O circuit and a second resistor coupled between the first I/O circuit and ground. Further, the integrated circuit includes a second I/O circuit coupled to the leakage detection circuit and the first and second resistors. The leakage circuit also tests the second I/O circuit for excessive leakage current in the test mode of operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.