Impedance spectroscopy measurement system
US6263294A · kind A · utility
3Cited by
10References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 2, 1998 |
| Grant date | Jul 17, 2001 |
| Priority date | — |
| Expiry date | Mar 2, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An impedance spectroscopy system characterizes the rheologic and thixotropic properties of solder paste and residues by measuring its impedance at various frequencies. The impedance spectroscopy system provides voltage and current inputs to a sample at various frequencies and measures the resulting impedance. The impedance spectroscopy system stores equivalent circuit parameters for multiple solder pastes and residues, controls the voltage and current inputs to the sample, displays measurement data in real-time, displays results, and notifies the operator if results exceed preset limits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.