Patent · US Expired

Apparatus for measurement of an optical pulse shape

US6266145A · kind A · utility

4Cited by
4References
4Claims
0Family size

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Key dates

Filing dateNov 16, 1999
Grant dateJul 24, 2001
Priority date
Expiry dateNov 16, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J11/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for measurement of an optical pulse shape intended to measure the temporal waveform of an ultrashort single optical pulse is disclosed. The present invention comprises a linearly chirped supercontinuum light source that is synchronized with an optical pulse to be measured; a nonlinear optical interferometer to transform the temporal waveform of an incident optical pulse into a spectrum using an incident light from said supercontinuum light source; and an optical spectrum analyzer to measure the wavelength of the light passing through the nonlinear interferometer so that it can measure the temporal waveform of a single optical pulse. The present invention employs the method that transforms the temporal waveform of an incident optical pulse into a spectrum and measures the wavelength using a linearly chirped supercontinuum light source, a nonlinear optical interferometer, and an optical spectrum analyzer. The present invention provides an apparatus for measurement of an optical pulse shape that is able to measure the waveform not with the repeated measurements but with a single shot measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.