System for measuring the concentration of gases
US6266998A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 15, 1999 |
| Grant date | Jul 31, 2001 |
| Priority date | — |
| Expiry date | Nov 15, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/7703
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for measuring the concentration of gases using gas-selective indicator substances in a chip-like carrier (1) with an optoelectronic scanning device (2). The chip-like carrier (2) has composite partial elements (3, 4) wherein one partial element (3) contains channels (5) for guiding the gas in the carrier (1), and another partial element (4) has at least one multireflection element (6) for guiding light. Each multireflection element (6) is provided with a layer (7) with indicator substances, which layer faces the gases to be measured and reacts with same in a gas-selective manner. The optoelectronic scanning device (2) has at least one radiation source (21) with an associated radiation detector (22), which are in optical functional connection with each multireflection element (6).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.