Calibration Process For Birefringence Measurement System
US6268914A · kind A · utility
16Cited by
23References
15Claims
0Family size
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Key dates
| Filing date | Jan 14, 2000 |
| Grant date | Jul 31, 2001 |
| Priority date | — |
| Expiry date | Jan 14, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/274
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dynamic self calibration process periodically calibrates a system for precisely measuring low-level birefringence properties (retardance and fast axis orientation) of optical materials. Variations in birefringence measurements can be caused by, for example, changes in the environmental conditions ( e.g., ambient pressure or temperature) under which birefringence properties of a sample are measured. In one implementation, the dynamic self calibration process repeatedly calibrates the system at different selected frequencies to compensate for different selected baseline variations.
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