Patent · US Expired

Glide height testing using a glide head apparatus with a piezoelectric actuator

US6272909A · kind A · utility

17Cited by

20References

4Claims

0Family size

Assignee

Seagate Technology LLC · US

Inventors

Wei H. Yao · Palo Alto, US
Ramesh Sundaram · Louisville, US

Key dates

Filing date	Jul 10, 2000
Grant date	Aug 14, 2001
Priority date	—
Expiry date	Jul 10, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG11B5/82
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A glide head apparatus for testing surface characteristics of a disc includes a gimbal, a slider and an actuator including a piezoelectric material disposed between the gimbal and the slider. A voltage applied across the piezoelectric material is controllable to cause the piezoelectric material to expand or contract depending on the applied voltage so as to vary the fly height between the slider and a disc under test. The fly height can be varied without substantially varying the linear velocity of the disc under test. Methods of testing surface characteristics of a disc using the glide head apparatus also are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.