Patent · US Expired

Method of detecting an analyte in a sample using semiconductor nanocrystals as a detectable label

US6274323A · kind A · utility

177Cited by
7References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 5, 2000
Grant dateAug 14, 2001
Priority date
Expiry dateMay 5, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/924
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The use of semiconductor nanocrystals as detectable labels in various chemical and biological applications is disclosed. The methods find use for detecting a single analyte, as well as multiple analytes by using more than one semiconductor nanocrystal as a detectable label, each of which emits at a distinct wavelength.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.