Patent · US Expired

Method of oxidizing a nitride film on a conductive substrate

US6274513A · kind A · utility

1Cited by
4References
45Claims
0Family size

Inventors

Key dates

Filing dateAug 23, 2000
Grant dateAug 14, 2001
Priority date
Expiry dateAug 23, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/859
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention discloses a method of oxidizing a nitride film on a conductive substrate comprising the following steps. First, a conductive substrate is provided, and a nitride film is formed on the main surface of the conductive substrate by performing film deposition process or directly nitridating the surface region of the conductive substrate. Then, a local electrode terminal (such as a conductive probe of a scanning-probe microscope) is provided, and a strong electric field is locally generated between the electrode terminal and the conductive substrate in an oxidizing environment, wherein the strong electric field passes through the nitride film, thereby oxidizing the nitride film region passed by the electric field. The method of oxidizing a nitride film according to the present invention can be applied to define patterns on a nitride film, to record information as memory media, and to form growth templates for the use in chemical selective formation processes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.