Method and apparatus for the measurement of film formation temperature of a latex
US6275049A · kind A · utility
0Cited by
5References
9Claims
0Family size
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Key dates
| Filing date | Feb 12, 1998 |
| Grant date | Aug 14, 2001 |
| Priority date | — |
| Expiry date | Feb 12, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods for determining the minimum film formation temperature of a latex are disclosed based upon the measurement of the conductivity of the latex as the temperature of the latex is varied. By plotting the latex's conductivity and temperature relationship, the minimum film formation temperature is determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.