Patent · US Expired

Enhanced single event upset immune latch circuit

US6275080A · kind A · utility

29Cited by
23References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 11, 2000
Grant dateAug 14, 2001
Priority date
Expiry dateJan 11, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/4125
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An enhanced single event upset immune CMOS latch circuit is formed of a first and a second cross-coupled invertor having isolation transistors in the path coupling the drains of the transistors in the first invertor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.