Dual point test probe for surface mount type circuit board connections
US6276956A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 12, 1999 |
| Grant date | Aug 21, 2001 |
| Priority date | — |
| Expiry date | Apr 12, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06788
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An insulative caliper type pivotal mounting pivotally secures two elongate arms that at their free ends mount a pair of electrically conductive pointed contacts. Electrical conductors connected to the contacts extend through each of the insulative elongate arms and through the elastic pivotal mounting from which they exit as a coaxial cable. On the distal end of the coaxial cable is positioned a quick connect-disconnect jack adapted for mounting onto a complementary jack in an electronic test instrument. The separation between the pointed ends of the contacts is infinitely adjustable by means of a thumb screw having reversed threaded studs extending from the opposed sides of the center thereof into threaded pivotal mountings on each of the elongate arms. The dual point test probe may be infinitely adjusted, maintained in the predetermined separation and may be manually manipulatable by the single hand of a user when testing current, voltage drop, capacitance, inductance or the like between the contact points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.