Patent · US Expired

Nonvolatile memory

US6277689A · kind A · utility

42Cited by
6References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 11, 1998
Grant dateAug 21, 2001
Priority date
Expiry dateJun 11, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/685
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A nonvolatile memory cell is formed in an embedded P-well without the necessity of including an overlaying control gate. As a result, normal logic process technology may be utilized to form the nonvolatile memory cell. Through the use of substrate hot electron injection and the formation of a lateral bipolar transistor whose emitter acts as a charge injector, programming efficiency is improved and the necessary programming voltages and currents can be reduced from the relatively high voltages and currents used in other devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.