Patent · US Expired

Method for fabricating ferroelectric capacitor

US6277760A · kind A · utility

3Cited by
5References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 24, 1999
Grant dateAug 21, 2001
Priority date
Expiry dateJun 24, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/694
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Method for fabricating a ferroelectric capacitor, including the steps of (1) foxing an etch stopper formed of any one of TiO.sub.2 and RuO.sub.2 a lower electrode, a ferroelectric layer, an upper electrode, and an etch mask layer formed of any one of Ti, Ru and Cr in succession on a substrate, (2) patterning the etch mask layer to a required form, (3) using the etch mask layer as a mask in etching the upper electrode, the ferroelectric layer, and the lower electrode at a time, to expose the etch stopper, and (4) removing the etch stopper and the etch mask layer, whereby allowing a simple and easy fabrication of the capacitor regardless of presence of steps.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.