Patent · US Expired

Configuration for testing integrated components

US6278285A · kind A · utility

3Cited by

6References

6Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Axel Weber · Hemhofen, DE
Matthias Kohler · Grafenau, DE
Michael Adam · Tettnang, DE

Key dates

Filing date	Jul 19, 1999
Grant date	Aug 21, 2001
Priority date	—
Expiry date	Jul 19, 2019

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/0433
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A configuration for testing integrated components includes a carrier frame into which test bases for receiving components can be inserted. The test bases have a clamping device and contacts which are associated with a contact plate, so that the components can be connected electrically to a tester head.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.