Methods for measuring curved distances on 3D and MIP images
US6278767A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 28, 1999 |
| Grant date | Aug 21, 2001 |
| Priority date | — |
| Expiry date | Apr 28, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention, in one form, is an imaging system for accurately determining a length of an object of interest (OOI). Particularly and in one embodiment, the OOI has a curvature in a direction non-parallel to a projection plane. Initially, after utilizing MIP images to identify the OOI, boundaries and a center of the OOI are determined for each image. Utilizing the determined boundaries and center, an OOI length is determined. Specifically, the OOI length is determined by determining a distance between each adjacent image and then summing the resulting values. The distance is then displayed on the MIP images by either distance indicators or numerical display.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.