Patent · US Expired

Hot carrier effect simulation for integrated circuits

US6278964A · kind A · utility

28Cited by
6References
46Claims
0Family size

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Key dates

Filing dateMay 29, 1998
Grant dateAug 21, 2001
Priority date
Expiry dateMay 29, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An approach for simulating hot carrier effects in an integrated circuit (IC) at the circuit level includes generating a hot carrier library of delay data for each cell in the IC, using the hot carrier library data to generate a set of scaled timing data for the IC and using the scaled timing data with a IC performance simulator to simulate the IC operation. The scaled timing data is based upon the cell delay data and time-based switching activity of each cell in the IC.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.