Patent · US Expired

System for predicting year-2000 instruction failures

US6279127A · kind A · utility

10Cited by
11References
28Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 20, 1998
Grant dateAug 21, 2001
Priority date
Expiry dateAug 20, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99942
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Object-code instruction traces are employed to analyze selected instructions of an application program for possible failure when confronted by a year-2000 date. The analysis includes directly identifying one or more instructions of the application program that may fail, as well as identifying whether the one or more instructions have a characteristic of a predefined false-positive failure pattern. A failure-pattern descriptor is assigned to each examined instruction which is indicative of whether the instruction may fail when confronted by a date in the year-2000 range, and whether the instruction is a possible false-positive failing instruction. The analysis employs user-specifiable run-control values, as well as predetermined filter-specification values in comparing traces of each selected object-code instruction to predefined instruction failure patterns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.