Method for adjusting spectral measurements to produce a standard Raman spectrum
US6281971A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 8, 2000 |
| Grant date | Aug 28, 2001 |
| Priority date | — |
| Expiry date | Sep 8, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for producing a standard Raman spectrum of a sample. A source of incident radiation is provided. Means provide an incident beam and a monitor beam from the incident radiation. The incident beam is directed to the sample and a Raman beam is generated from the sample. Spectral data may be collected directly from the monitor beam and the Raman beam simultaneously. The occurrence of a frequency shift in the incident radiation is determined. One spectral measurement is made after the occurrence of the frequency shift, or a first spectral measurement is made before and a second spectral measurement is made after the frequency shift. One or more arithmetic calculations are applied to the single spectral measurement, or the second spectral measurement is subtracted from the first spectral measurement. One or more integral transforms are applied to the resulting spectral measurement data to produce the standard Raman spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.