Patent · US Expired

Flash memory device with program status detection circuitry and the method thereof

US6282121A · kind A · utility

62Cited by
1References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 6, 2000
Grant dateAug 28, 2001
Priority date
Expiry dateSep 6, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3454
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A nonvolatile semiconductor memory device includes a program state detection circuit for checking a state of programmed memory cells. The program state detection circuit checks program pass/fail using data transmitted through a column selection circuit, according to a column address having redundancy information. Therefore, it is possible to overcome the problem that the memory device is regarded as a fail device owing to a defective column.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.