Time domain reflectometry apparatus and method
US6285195A · kind A · utility
11Cited by
13References
13Claims
0Family size
Inventor
Key dates
| Filing date | Mar 16, 1998 |
| Grant date | Sep 4, 2001 |
| Priority date | — |
| Expiry date | Mar 16, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/11
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reference length of electrically conductive material having a predetermined electrical length and impedance permanently inserted in a time domain reflectometer measuring path prior to the connection point to the cable-under-test. Measurement to the start of the reference length is used to establish a reference position within the measurement path for subsequent time domain reflectometry measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.