Method and arrangement for measuring temperature of a semiconductor component in an inactive state
US6286996A · kind A · utility
4Cited by
9References
24Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 17, 1999 |
| Grant date | Sep 11, 2001 |
| Priority date | — |
| Expiry date | Sep 17, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03F3/19
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
The present invention relates to a method and to arrangements for measuring temperature in an intermittently operating semiconductor. The method comprises the following steps: PA1 establishing that the semiconductor is in an inactive period; PA1 connecting a measuring circuit to the semiconductor; PA1 measuring a temperature-dependent electric quantity of the semiconductor component; and PA1 converting the measured quantity to a temperature value that corresponds to the temperature of the semiconductor component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.