Patent · US Expired

Integrated circuit and method

US6287924A · kind A · utility

80Cited by
15References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 1999
Grant dateSep 11, 2001
Priority date
Expiry dateSep 28, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/017
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Sidewall spacers extending above a silicon gate with the distance between the spacers exceeding the length of the gate are used to confine selective silicon growth of the gate and subsequent self-aligned silicidation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.