Quantitative characterization of obliquely-deposited substrates of gold by atomic force microscopy: influence of substrate topography on anchoring of liquid crystals
US6288392A · kind A · utility
34Cited by
1References
51Claims
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Key dates
| Filing date | Jan 19, 1999 |
| Grant date | Sep 11, 2001 |
| Priority date | — |
| Expiry date | Jan 19, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/852
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
Scanning probe microscopy is used to quantitatively characterize structural anisotropy within obliquely deposited metal films. Whereas visual inspection of AFM images (real space or reciprocal space) reveals no obvious structural anisotropy within these gold films, by quantitative analysis of the AFM profiles, subtle structural anisotropy is observed. The quantitative characterization provides a method to estimate the influence of anisotropy on the orientations of supported mesogenic layers.
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