Apparatus and method for measuring resonance frequency of electric circuit
US6288530A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 7, 1999 |
| Grant date | Sep 11, 2001 |
| Priority date | — |
| Expiry date | Oct 7, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/07
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring the resonance frequency of an electric circuit with low disturbance and high accuracy is disclosed. An electrooptic crystal, whose refractive index changes according to the strength of an applied electric field, is used as a sensor, and a frequency-sweep electromagnetic wave is applied to a resonance section of an electric circuit from an external device. The induced current flowing in the resonance section generates an electric field, which is detected by measuring the refractive index of the electrooptic crystal in the form of the relevant light intensity. The resonance frequency is determined based on the maximum electric field strength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.