Patent · US Expired

Device for temperature measurement

US6290389A · kind A · utility

10Cited by

14References

1Claims

0Family size

Assignee

Raytek GmbH · US

Inventors

Volker Schmidt · Lexington, US
William Menchine · Santa Cruz, US
Hans-Jurgen Rostalski · Oberkochen, DE
Frank Wyrowski · Jena, DE

Key dates

Filing date	Jan 19, 2001
Grant date	Sep 18, 2001
Priority date	—
Expiry date	Jan 19, 2021

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S33/21
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a device for temperature measurement. The heat radiation emanating from a measurement spot on an object of measurement is imaged by an optical system onto a detector. A sighting arrangement is also provided which has a diffractive optical system by which a light intensity distribution is produced which corresponds to the position and size of the measurement spot on the object of measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.