Patent · US Expired

Method for making MOS transistors

US6291299A · kind A · utility

2Cited by
3References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 14, 1999
Grant dateSep 18, 2001
Priority date
Expiry dateOct 14, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/021

Abstract

An improved method of forming an MOS transistor, which includes forming a polysilicon layer on a silicon dioxide layer, which is formed on a substrate. After etching the polysilicon and silicon dioxide layers to define a gate electrode and a gate oxide, dopants are implanted into the substrate. Following that implantation step, the exposed portion of the gate oxide is cleaned and sealed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.