Disk drive having built-in self-test system for characterizing performance of the drive
US6292912A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 27, 1998 |
| Grant date | Sep 18, 2001 |
| Priority date | — |
| Expiry date | Feb 27, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3485
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A disk drive has a normal mode of operation and a built-in self-test (BIST) mode of operation for producing a sequence of channel metrics {.GAMMA..sub.n }. The disk drive includes a recording surface having a plurality of bit cells and a transducer for reading the plurality of bit cells to produce a noise-corrupted read signal. The disk drive further includes means responsive to the noise-corrupted read signal for generating a sequence of observed samples {y.sub.n }, the sequence of observed samples {y.sub.n } forming a sequence of observed-sample subsequences {Y.sub.n }. An expected sample generator operates during the BIST mode of operation to provide a sequence of expected samples {w.sub.n }, the sequence of expected samples forming a sequence of expected-sample subsequences {W.sub.n }. A channel metrics .GAMMA..sub.n computation system computes a sequence of channel metrics {.GAMMA..sub.n }. Each channel metric .GAMMA..sub.n is a function of a distance determined from one of the observed-sample subsequences Y.sub.n to the corresponding expected-sample subsequence W.sub.n. Each channel metric .GAMMA..sub.n is independent of the earliest observed sample in every prior observed-sa…
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