Apparatus and method for detecting samples labeled with material having strong light scattering properties, using reflection mode light and diffuse scattering
US6294327A · kind A · utility
28Cited by
7References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 26, 1998 |
| Grant date | Sep 25, 2001 |
| Priority date | — |
| Expiry date | Jan 26, 2018 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB01J2219/00702
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for imaging a sample labeled with a material having a strong light scattering and reflecting properties are provided. A typical material having strong light scattering and reflecting properties is a metal colloid. The imaging system employs a light scattering and reflecting illumination technique. The sample can be imaged with reflection mode imaging along or with a combination of reflection mode and scatter mode imaging.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.