Pulsed ion source for ion trap mass spectrometer
US6294780A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 1999 |
| Grant date | Sep 25, 2001 |
| Priority date | — |
| Expiry date | Apr 1, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/147
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An ion source for use with an ion trap mass spectrometer. The ion source includes an electron source which produces a stream of electrons. The electrons are injected into an ionization chamber by the action of a repeller plate and electron lens. Inside the ionization chamber, the electrons interact with a gas-phase sample to produce sample ions through the electron ionization process, or with a reagent gas to form reagent ions as part of a chemical ionization process. The sample ions produced are extracted from the ionization chamber by the action of an ion repeller and an ion lens. The potentials on the electron repeller and lens, and ion repeller and lens are controlled to direct the electron stream away from the ionization chamber or to direct the sample ion beam away from an ion trap at the appropriate times during measurement of the sample ions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.