Semiconductor switch fault detection
US6297661A · kind A · utility
12Cited by
11References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 19, 1999 |
| Grant date | Oct 2, 2001 |
| Priority date | — |
| Expiry date | Apr 19, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/16528
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for detecting various fault conditions in semiconductor devices. A variable voltage reference is compared to the voltage output of the device during device turn-on to detect circuit fault conditions. The fault condition is then communicated to a controller.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.