Method and circuit for testing an analog-to-digital converter module on a data processing system having an intermodule bus
US6297757A · kind A · utility
5Cited by
8References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 11, 1999 |
| Grant date | Oct 2, 2001 |
| Priority date | — |
| Expiry date | Feb 11, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/12
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A data processing system (20) includes a plurality of modules (44, 48) and an analog-to-digital converter (ADC) (46). The ADC (46) includes at least one port terminal (66) for transmitting test information from the ADC (46). The plurality of modules (44,48) and the ADC (46) are coupled to a central processing unit (CPU) (22) via an intermodule bus (42). A tester can exchange test information with the ADC (46) directly through the port terminal (66) instead of using the intermodule bus (42). Also, various sub-modules (62, 64, 60, 74) of the ADC (46) can be independently tested without performing a conversion process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.