Patent · US Expired

Method for in-cassette wafer center determination

US6298280A · kind A · utility

58Cited by
17References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 1998
Grant dateOct 2, 2001
Priority date
Expiry dateSep 28, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/141
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A system for positioning an end effector of a wafer handling robot with respect to a wafer to be extracted from a cassette, and for thereafter reading an indicial mark on the wafer. The system includes a pair of sensor units fixedly mounted on the end effector, which sensor units are capable of detecting the wafer edge upon approach of the end effector toward the wafer. Based on the positions of the end effector when the first and then the second sensor units detect the edge of the wafer, a computer may determine the orientation of the end effector with respect to the wafer, and adjust a position of the end effector to a center of the wafer. Thereafter, the indicial mark on the wafer may be read by a camera by withdrawing the wafer from the cassette on the end effector, positioning the center of the wafer over the central axis of rotation of the wafer handling robot, and rotating the robot until the indicial mark is located under the camera.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.