Scattering parameter calibration system and method
US6300775A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 2, 1999 |
| Grant date | Oct 9, 2001 |
| Priority date | — |
| Expiry date | Feb 2, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method of calibrating an S parameter measurement instrument (such as a vector network analyzer) in which the number of calibrations required to fully characterize the error model of an n-port system is n/2 calibrations for an even number of ports and (n+1)/2 calibrations for an odd number of ports. Each test port in the system is involved in at least one full calibration, thus n/2 test paths are fully calibrated. For each measured test path, the error terms of the applicable error model are calculated. These error terms are then decoupled from the associated test path into error parameters that are localized to the individual test ports of the test path. Having localized the error parameters, the error model for each test port can then be treated independently from the other test ports. The error terms for the test paths that are not calibrated are then constructed using the localized error parameters for the individual test ports.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.