Patent · US Expired

Material strip with arranged groups of dark and light areas

US6302330A · kind A · utility

1Cited by
18References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 19, 1999
Grant dateOct 16, 2001
Priority date
Expiry dateNov 19, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06K19/06037
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Method and device for checking patterns (1) disposed on a material strip (30) which patterns (1) consist of groups of dark and light areas (2,2*,3,3*) succeeding in the travelling direction (v) of the material strip (30) and the checking respectively, by displacing the position of the dark areas (2,3) and/or the light areas (2*,3*) of one group with respect to a related detector (8,9) in regard to the dark areas (2,3) and/or light areas (2*,3*) of another group with respect to another related detector (8,9) by detecting the existence or non-existence of dark areas and/or light areas and by creating a sequence of output signals dependent on the result of the detection by combining the output signals comprising information concerning said dark or light areas (2,2*,3,3*) of each detector (8,9) with the output signals depending on the detection of one of said dark or light areas (2,2*,3,3*) of the other detector (8,9) in a predetermined way by for example alternately activating each detector (8,9) by the other detector (8,9) and by comparing this sequence of output signals with a predetermined sequence of signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.