Patent · US Expired

Photogrammetric analytical measurement system

US6304669A · kind A · utility

24Cited by
5References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 9, 1998
Grant dateOct 16, 2001
Priority date
Expiry dateNov 9, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C11/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A photogrammetric measurement system produces a survey map based on a set of photographed pictures obtained at two different photographing positions. Each of the pictures includes at least one continuous line and at least three conspicuous points away from the continuous line, with at least one of the conspicuous points and remaining conspicuous points being placed at opposing sides of the continuous line. The set of pictures are produced as a first picture and a second picture. First lines are produced between the conspicuous points on the first picture such that the lines intersect the continuous line, thereby generating intersecting points. Second lines are produced between the conspicuous points on the second picture such that the lines intersect the continuous line, thereby generating further intersecting points. A set of corresponding intersecting points are designated on the first and second pictures, and intersecting points are produced on the survey map based on the designated corresponding intersecting points. A line, connecting the intersecting points, is thus produced on the survey map.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.