Patent · US Expired

Quartz glass component for a reactor housing a method of manufacturing same and use thereof

US6306489A · kind A · utility

41Cited by
3References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 1998
Grant dateOct 23, 2001
Priority date
Expiry dateDec 18, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24999
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

A quartz glass component for a reactor chamber, especially of a plasma etching device, comprises a substrate of a first quartz glass quality with an inner surface having an average roughness depth R.sub.a of more than 1 .mu.m, facing the inside of the reactor. To minimize particles in the reactor chamber, and to give the inner surface high adhesiveness for layers deposited on it and a long service life, a roughness zone is formed on the substrate by an open pore bubble layer made of a second quartz glass quality. The quartz glass component may be made by forming a blank from a granulate containing SiO.sub.2, and partial or complete vitrification of the blank by heating to a temperature above 1,000.degree. C. During the forming of the inner surface of the blank, an additional constituent is added to the granulate containing siO.sub.2 in a roughness zone. The additional constituent reacts during the vitrification to release a gas, which forms a bubble layer during vitrification of the roughness zone.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.