Patent · US Expired

Method for testing an electronic circuit

US6308291A · kind A · utility

34Cited by

9References

12Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Ernst-Josef Kock · Kirchseeon, DE
Peter Schneider · Dublin, US

Key dates

Filing date	Sep 18, 1998
Grant date	Oct 23, 2001
Priority date	—
Expiry date	Sep 18, 2018

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318563
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing an electronic circuit is described, in which the actual state of circuit components which have previously been activated on a test basis after an initial initialization is compared with a setpoint state. Of the circuit components to be tested, essentially only those circuit components are operated simultaneously which, under the given circumstances, can be expected to interact in the context.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.