Patent · US Expired

Multi-stage profiler

US6308324A · kind A · utility

14Cited by
7References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 10, 1999
Grant dateOct 23, 2001
Priority date
Expiry dateJun 10, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2201/88
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A profiler that operates in a multi-stage environment is disclosed. As program code undergoes a series of transformations, branches of interest are selected and tracked. Regardless of how many transformations are involved only a single instrumentation/data gathering phase is required. The gathered profile data is then used to perform various optimizations at the differing transformation stages.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.